Phil Nigh

Publication Activity (10 Years)

Years Active: 1988-2016
Publications (10 Years): 1

Top Topics

Learning Processes

Statistical Significance

Top Venues

IEEE Des. Test Comput.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Phil Nigh
Testing in the year 2024 - big changes are coming. ETS (2016)
C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy
Board manufacturing test correlation to IC manufacturing test. ITC (2014)
Matt Grady, Bradley Pepper, Joshua Patch, Michael Degregorio, Phil Nigh
Adaptive testing - Cost reduction through test pattern sampling. ITC (2013)
Anne E. Gattiker, Phil Nigh
Guest Editors' Introduction: Yield Learning Processes and Methods. IEEE Des. Test Comput. 29 (1) (2012)
Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar
Physically-Aware N-Detect Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (2) (2012)
Phil Nigh
How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? ITC (2012)
Anne E. Gattiker, Phil Nigh
Using well/substrate bias manipulation to enhance voltage-test-based defect detection. ITC (2011)
Phil Nigh
Industry leaders panel - How will testing change in the next 10 years? ITC (2011)
Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin
Application of non-parametric statistics of the parametric response for defect diagnosis. ITC (2009)
Phil Nigh
The Evolving Role of Test ... it is now a "Value Add" Operation. DFT (2008)
François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh
How Many Test Patterns are Useless? VTS (2008)
Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar
Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. ITC (2008)
Phil Nigh
Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. IEEE Des. Test Comput. 23 (2) (2006)
Phil Nigh
Session Abstract. VTS (2006)
Vikram Iyengar, Phil Nigh
Defect-Oriented Test for Ultra-Low DPM. Asian Test Symposium (2005)
Phil Nigh, Anne E. Gattiker
Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ITC (2004)
Phil Nigh
Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. ITC (2004)
Phil Nigh
Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". ITC (2004)
Phil Nigh
The Increasing Importance of On-line Testing to Ensure High-Reliability Products. ITC (2003)
Phil Nigh
Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. ITC (2002)
Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
Debating the Future of Burn-In. VTS (2002)
Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh
MINVDD Testing for Weak CMOS ICs. VTS (2001)
Phil Nigh, Anne E. Gattiker
Test method evaluation experiments and data. ITC (2000)
Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC (1999)
Phil Nigh
SIA Roadmap: test must not limit future technologies. ITC (1998)
Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika
Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC (1998)
Phil Nigh, David P. Vallett, Atul Patel, Jason Wright
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC (1998)
Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh
Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT (1998)
Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
Best Methods for At-Speed Testing? VTS (1998)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC (1997)
Adit D. Singh, Phil Nigh, C. Mani Krishna
Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. ITC (1997)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS (1997)
Phil Nigh, Donato O. Forlenza, Franco Motika
Application and Analysis of IDDQ Diagnostic Software. ITC (1997)
Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck
Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS (1996)
Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix
ASIC Test Cost/Strategy Trade-offs. ITC (1994)
Phil Nigh, Wojciech Maly
Test Generation for Current Testing (CMOS ICs). IEEE Des. Test Comput. 7 (1) (1990)
Phil Nigh, Wojciech Maly
Layout-driven test generation. ICCAD (1989)
Wojciech Maly, Pranab K. Nag, Phil Nigh
Testing oriented analysis of CMOS ICs with opens. ICCAD (1988)
Derek Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly
Current sensing for built-in testing of CMOS circuits. ICCD (1988)
Wojciech Maly, Phil Nigh
Built-in current testing-feasibility study. ICCAD (1988)