Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions.

Phil Nigh Anne E. Gattiker

Published in: ITC (2004)

Keyphrases

statistical analysis
computer vision
multiresolution
quantitative analysis
neural network
real world
data mining
information retrieval
decision making
image processing
three dimensional
evolutionary algorithm
hidden markov models
classification accuracy