Test Generation for Current Testing (CMOS ICs).

Phil Nigh Wojciech Maly

Published in: IEEE Des. Test Comput. (1990)

Keyphrases

test generation
test cases
symbolic execution
test sequences
static analysis
software testing
design automation
quality assurance
code coverage
low voltage
mutation testing
test data generation
high speed
circuit design
image data
databases
project management
open source
database systems
computer vision