Binning for IC Quality: Experimental Studies on the SEMATECH Data.
Adit D. SinghDavid R. Lakin IIGaurav SinhaPhil NighPublished in: DFT (1998)
Keyphrases
- experimental study
- data sets
- data quality
- high quality
- data processing
- raw data
- data collection
- data analysis
- original data
- statistical analysis
- data structure
- low quality
- prior knowledge
- experimental evaluation
- input data
- database
- training data
- sensor data
- spatial data
- information systems
- historical data
- neural network
- learning algorithm
- statistical methods
- experimental data
- computer systems
- data sources
- feature space