Pia Sanda

Publication Activity (10 Years)

Years Active: 1998-2008
Publications (10 Years): 0

Publications

Dimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia Sanda
Soft Errors: System Effects, Protection Techniques and Case Studies. DATE (2008)
Pradeep Ramachandran, Prabhakar Kudva, Jeffrey W. Kellington, John Schumann, Pia Sanda
Statistical Fault Injection. DSN (2008)
Subhasish Mitra, Pia Sanda, Norbert Seifert
Soft Errors: Technology Trends, System Effects, and Protection Techniques. IOLTS (2007)
Sarita V. Adve, Pia Sanda
Guest Editors' Introduction: Reliability-Aware Microarchitecture. IEEE Micro 25 (6) (2005)
Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson
Latchup Analysis Using Emission Microscopy. Microelectron. Reliab. 43 (9-11) (2003)
Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda
Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC (2003)
Stanislav Polonsky, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Pia Sanda
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis. Asian Test Symposium (2000)
Wei Hwang, George Diedrich Gristede, Pia Sanda, Shao Y. Wang, David F. Heidel
Implementation of a self-resetting CMOS 64-bit parallel adder with enhanced testability. IEEE J. Solid State Circuits 34 (8) (1999)
William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia Sanda, Steve Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA). ITC (1999)
Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika
Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC (1998)