Login / Signup

Current sensing for built-in testing of CMOS circuits.

Derek FelthamPhil NighL. Richard CarleyWojciech Maly
Published in: ICCD (1988)
Keyphrases
  • high speed
  • analog vlsi
  • circuit design
  • low voltage
  • delay insensitive
  • real time
  • low cost
  • power consumption
  • vlsi circuits
  • sensor networks
  • neural network
  • information systems
  • data streams
  • image sensor
  • cmos technology