Osei Poku

Publication Activity (10 Years)

Years Active: 2006-2013
Publications (10 Years): 0

Top Topics

Resolution Enhancement

Multiresolution

Statistical Significance

Discontinuity Preserving

Top Venues

IEEE Des. Test Comput.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Yang Xue, Osei Poku, Xin Li, Ronald D. Blanton
PADRE: Physically-Aware Diagnostic Resolution Enhancement. ITC (2013)
Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar
Physically-Aware N-Detect Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (2) (2012)
R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku
Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. IEEE Des. Test Comput. 29 (1) (2012)
Hongfei Wang, Osei Poku, Xiaochun Yu, Sizhe Liu, Ibrahima Komara, Ronald D. Blanton
Test-data volume optimization for diagnosis. DAC (2012)
Wing Chiu Tam, Osei Poku, Ronald D. Blanton
Systematic defect identification through layout snippet clustering. ITC (2010)
Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton
Automated failure population creation for validating integrated circuit diagnosis methods. DAC (2009)
Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton
Controlling DPPM through Volume Diagnosis. VTS (2009)
Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton
Precise failure localization using automated layout analysis of diagnosis candidates. DAC (2008)
Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton
Physically-Aware N-Detect Test Pattern Selection. DATE (2008)
Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar
Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. ITC (2008)
Osei Poku, Ronald D. Blanton
Delay defect diagnosis using segment network faults. ITC (2007)
Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer
Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. 23 (5) (2006)
Rao Desineni, Osei Poku, Ronald D. Blanton
A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. ITC (2006)