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Extracting Defect Density and Size Distributions from Product ICs.
Jeffrey E. Nelson
Thomas Zanon
Jason G. Brown
Osei Poku
R. D. (Shawn) Blanton
Wojciech Maly
Brady Benware
Chris Schuermyer
Published in:
IEEE Des. Test Comput. (2006)
Keyphrases
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probability distribution
real time
life cycle
probability measure
standard deviation
probability density
normal distribution
data mining
information systems
training data
data structure
random variables
small size
aspect ratio
defect detection
heavy tailed