ASPECT RATIO
Experts
- Sang Won Bae
- Zhanyi Hu
- Nan Sun
- Guanghui Wang
- Zuzana Kukelova
- Ching-Nung Yang
- Tomás Pajdla
- Michael T. Goodrich
- Csaba D. Tóth
- Nutan Limaye
- Jovisa D. Zunic
- Lei Qiu
- Kenichi Kanatani
- Yuanjin Zheng
- Bettina Speckmann
- Kareem Ragab
- Hongbin Zha
- Yasuaki Kakehi
- Jeonggoo Song
- Kevin W. Bowyer
- Adrien Bartoli
- Liter Siek
- Stephen G. Kobourov
- Marco Pereañez
- Reinaldo Boris Arellano-Valle
- João Pedro Barreto
- Fumihiro Inoue
- Martin Bujnak
- Takeshi Shakunaga
- Andreas Krebs
- Xueting Wang
- Ashim Garg
- Lijie Wang
- Robert M. Haralick
- Helder Araújo
- Rui Paulo Martins
- Chih-Hsing Liu
- Yukio Fukui
- Liang Qian
Venues
- CoRR
- CVPR
- Remote. Sens.
- Sensors
- Pattern Recognit.
- ICCV
- IEEE Access
- Pattern Recognit. Lett.
- IEEE Trans. Instrum. Meas.
- ICIP
- IROS
- NEMS
- Discret. Math.
- IGARSS
- ICPR
- IEEE Geosci. Remote. Sens. Lett.
- ICASSP
- NeuroImage
- J. Comb. Theory, Ser. A
- ICRA
- ISCAS
- Multim. Tools Appl.
- J. Comput. Phys.
- Electron. Notes Discret. Math.
- IEEE Trans. Geosci. Remote. Sens.
- Inf. Process. Lett.
- IEEE J. Solid State Circuits
- Comput. Vis. Image Underst.
- Appl. Math. Comput.
- Vis. Comput.
- Int. J. Comput. Vis.
- Microelectron. J.
- Comput. Chem. Eng.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISSCC
- 3DIC
- Comput. Geom.
- Electron. J. Comb.
- AAAI
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