Rao Desineni

Publication Activity (10 Years)

Years Active: 2000-2016
Publications (10 Years): 1

Top Topics

Attribute Values

Automatic Diagnosis

Model Based Reasoning

Top Venues

Publications

Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli
Pylon: Towards an integrated customizable volume diagnosis infrastructure. ITC (2016)
Shobhit Malik, Thomas Herrmann, Sriram Madhavan, Rao Desineni, Chris Schuermyer, Geir Eide
Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. IEEE Des. Test 30 (4) (2013)
Rao Desineni, Leah Pastel, Maroun Kassab, Robert Redburn
Hard to find, easy to find systematics; just find them. ITC (2010)
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton
Extraction of defect density and size distributions from wafer sort test results. DATE (2006)
Ronald D. Blanton, Kumar N. Dwarakanath, Rao Desineni
Defect Modeling Using Fault Tuples. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (11) (2006)
Rao Desineni, Osei Poku, Ronald D. Blanton
A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. ITC (2006)
Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton
Multiple-detect ATPG based on physical neighborhoods. DAC (2006)
Rao Desineni, R. D. (Shawn) Blanton
Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction. VTS (2005)
Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC (2004)
Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels
Fault Tuples in Diagnosis of Deep-Submicron Circuits. ITC (2002)
Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton
Universal test generation using fault tuples. ITC (2000)