Fault Tuples in Diagnosis of Deep-Submicron Circuits.
Ronald D. BlantonJohn T. ChenRao DesineniKumar N. DwarakanathWojciech MalyThomas J. VogelsPublished in: ITC (2002)
Keyphrases
- fault models
- fault diagnosis
- fault detection
- vlsi circuits
- model based diagnosis
- multiple faults
- analog circuits
- fault management
- fault model
- fault detection and diagnosis
- low power
- digital circuits
- expert systems
- normal operation
- electron beam
- fault isolation
- database
- failure modes
- repair actions
- diagnostic reasoning
- model based reasoning
- horn clauses
- neural network
- mixed signal
- analog vlsi
- network management
- fault detection and isolation
- electronic circuits
- diagnostic tests
- automatic diagnosis
- integrated circuit
- high speed
- data streams