Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.
Thomas J. VogelsThomas ZanonRao DesineniR. D. (Shawn) BlantonWojciech MalyJason G. BrownJeffrey E. NelsonY. FeiX. HuangPadmini GopalakrishnanMahim MishraVyacheslav RovnerS. TiwaryPublished in: ITC (2004)
Keyphrases
- recently developed
- wide variety
- real world
- lower and upper bounds
- computationally efficient
- small number
- computational cost
- three dimensional
- significant improvement
- computational complexity
- image segmentation
- input data
- learning algorithm
- machine learning algorithms
- times faster
- convex hull
- data mining
- neural network
- nearest neighbour