John M. Carulli

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 6

Top Topics

Defect Detection

Statistical Methods

Integrated Circuit

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Ke Huang, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. IEEE Des. Test 41 (2) (2024)
Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang
Systematic defect detection methodology for volume diagnosis: A data mining perspective. ITC (2017)
Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (12) (2017)
Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli
Consistency in wafer based outlier screening. VTS (2016)
Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli
Pylon: Towards an integrated customizable volume diagnosis infrastructure. ITC (2016)
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Vijay Reddy
Controlling Aging in Timing-Critical Paths. IEEE Des. Test 33 (4) (2016)
Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
Yield prognosis for fab-to-fab product migration. VTS (2015)
Ke Huang, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris
Recycled IC Detection Based on Statistical Methods. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (6) (2015)
Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee
Innovative practices session 5C: Machine learning and data analysis in test. VTS (2014)
John M. Carulli
Special session 11B: ITRS adaptive test update. VTS (2014)
Senthil Arasu, Mehrdad Nourani, Frank Cano, John M. Carulli, Vijay Reddy
Asymmetric aging of clock networks in power efficient designs. ISQED (2014)
Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain. Proc. IEEE 102 (8) (2014)
Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler
Test data analytics - Exploring spatial and test-item correlations in production test data. ITC (2013)
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy
A design-for-reliability approach based on grading library cells for aging effects. ITC (2013)
Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli
Performance entitlement by exploiting transistor's BTI recovery. ISQED (2013)
Ke Huang, John M. Carulli, Yiorgos Makris
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry. ITC (2013)
Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess
Impact of Negative Bias Temperature Instability on Product Parametric Drift. ITC (2004)