Sounil Biswas

Publication Activity (10 Years)

Years Active: 2003-2016
Publications (10 Years): 1

Top Topics

Machine Learning

Top Venues

IEEE Des. Test Comput.

ACM Trans. Design Autom. Electr. Syst.

Publications

Shalini Arora, Aman Aflaki, Sounil Biswas, Masashi Shimanouchi
SERDES external loopback test using production parametric-test hardware. ITC (2016)
Sounil Biswas, Hongfei Wang, R. D. (Shawn) Blanton
Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis. ACM Trans. Design Autom. Electr. Syst. 19 (2) (2014)
Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee
Innovative practices session 5C: Machine learning and data analysis in test. VTS (2014)
Sounil Biswas, Bruce Cory
An Industrial Study of System-Level Test. IEEE Des. Test Comput. 29 (1) (2012)
Sounil Biswas, Ronald D. Blanton
Reducing Test Execution Cost of Integrated, Heterogeneous Systems Using Continuous Test Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (1) (2011)
Sounil Biswas, Ronald D. Blanton
Maintaining Accuracy of Test Compaction through Adaptive Re-learning. VTS (2009)
Sounil Biswas, Ronald D. Blanton
Improving the Accuracy of Test Compaction through Adaptive Test Update. ITC (2008)
Sounil Biswas, R. D. (Shawn) Blanton
Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data. VTS (2008)
Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi
Specification Test Compaction for Analog Circuits and MEMS CoRR (2007)
Sounil Biswas, Ronald D. Blanton
Statistical Test Compaction Using Binary Decision Trees. IEEE Des. Test Comput. 23 (6) (2006)
Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi
Specification Test Compaction for Analog Circuits and MEMS. DATE (2005)
Sounil Biswas, Kumar N. Dwarakanath, R. D. (Shawn) Blanton
Generalized Sensitization using Fault Tuples. VTS (2004)
Sounil Biswas, Baquer Mazhari
A Path Sensitization Technique for Testing of Switched Capacitor Circuits. VLSI Design (2003)