Dragoljub Gagi Drmanac

Publication Activity (10 Years)

Years Active: 2008-2014
Publications (10 Years): 0

Top Topics

Information Visualization

Machine Learning

Inductive Logic Programming

Top Venues

Publications

Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee
Innovative practices session 5C: Machine learning and data analysis in test. VTS (2014)
Dragoljub Gagi Drmanac, Michael Laisne
Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study. ITC (2011)
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Understanding customer returns from a test perspective. VTS (2011)
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Forward prediction based on wafer sort data - A case study. ITC (2011)
Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE (2011)
Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja
Mining AC delay measurements for understanding speed-limiting paths. ITC (2010)
Po-Hsien Chang, Dragoljub Gagi Drmanac, Li-C. Wang
Online selection of effective functional test programs based on novelty detection. ICCAD (2010)
Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang
A non-parametric approach to behavioral device modeling. ISQED (2010)
Nicholas Callegari, Dragoljub Gagi Drmanac, Li-C. Wang, Magdy S. Abadir
Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch. DAC (2010)
Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir
Minimizing outlier delay test cost in the presence of systematic variability. ITC (2009)
Dragoljub Gagi Drmanac, Frank Liu, Li-C. Wang
Predicting variability in nanoscale lithography processes. DAC (2009)
Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang
A Study of Outlier Analysis Techniques for Delay Testing. ITC (2008)