Login / Signup
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.
Dragoljub Gagi Drmanac
Nik Sumikawa
LeRoy Winemberg
Li-C. Wang
Magdy S. Abadir
Published in:
DATE (2011)
Keyphrases
</>
test set
test data
data sets
training data
data analysis
error rate
data sources
machine learning
decision trees
labeled data
multidimensional data
sensitive information
multi dimensional
data points
training set
feature extraction
data mining