Nik Sumikawa

Publication Activity (10 Years)

Years Active: 2011-2020
Publications (10 Years): 9

Top Topics

Tensor Decomposition

Correlation Analysis

Multiclass Classification

Top Venues

Publications

Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa
Learning A Wafer Feature With One Training Sample. ITC (2020)
Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa
Deploying A Machine Learning Solution As A Surrogate. ITC (2019)
Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa
Wafer Pattern Recognition Using Tucker Decomposition. VTS (2019)
Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Wafer Plot Classification Using Neural Networks and Tensor Methods. ITC-Asia (2019)
Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Primitive Concept Identification In A Given Set Of Wafer Maps. VLSI-DAT (2019)
Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Concept Recognition in Production Yield Data Analytics. ITC (2018)
Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Discovering Interesting Plots in Production Yield Data Analytics. CoRR (2018)
Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg
Learning the process for correlation analysis. VTS (2017)
Nik Sumikawa, Matt Nero, Li-C. Wang
Kernel based clustering for quality improvement and excursion detection. ITC (2017)
Amr Haggag, Nik Sumikawa, Aamer Shaukat
Reliability/yield trade-off in mitigating "no trouble found" field returns. IOLTS (2015)
Amr Haggag, Nik Sumikawa, Aamer Shaukat, J. K. Jerry Lee, Nick Aghel, Charlie Slayman
Mitigating "No trouble found" component returns. IRPS (2015)
Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
Yield optimization using advanced statistical correlation methods. ITC (2014)
Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
Multivariate outlier modeling for capturing customer returns - How simple it can be. IOLTS (2014)
Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
A pattern mining framework for inter-wafer abnormality analysis. ITC (2013)
Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang
Data mining based prediction paradigm and its applications in design automation. VLSI-DAT (2012)
Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang
Functional test content optimization for peak-power validation - An experimental study. ITC (2012)
Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Screening customer returns with multivariate test analysis. ITC (2012)
Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
An experiment of burn-in time reduction based on parametric test analysis. ITC (2012)
Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir
Novel test detection to improve simulation efficiency - A commercial experiment. ICCAD (2012)
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Understanding customer returns from a test perspective. VTS (2011)
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Forward prediction based on wafer sort data - A case study. ITC (2011)
Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE (2011)