LeRoy Winemberg

Publication Activity (10 Years)

Years Active: 2005-2021
Publications (10 Years): 15

Top Topics

Machine Learning

Fault Detection

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. ACM Trans. Design Autom. Electr. Syst. 26 (3) (2021)
Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. ETS (2019)
Miao Tony He, Gustavo K. Contreras, Dat Tran, LeRoy Winemberg, Mark M. Tehranipoor
Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. IEEE Trans. Very Large Scale Integr. Syst. 25 (9) (2017)
Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev
Evaluation of loop transfer function based dynamic testing of LDOs. ITC-Asia (2017)
Mehdi Sadi, Sukeshwar Kannan, LeRoy Winemberg, Mark M. Tehranipoor
SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (5) (2017)
Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg
Some considerations on choosing an outlier method for automotive product lines. ITC (2017)
Mehdi Sadi, Gustavo K. Contreras, Jifeng Chen, LeRoy Winemberg, Mark M. Tehranipoor
Design of Reliable SoCs With BIST Hardware and Machine Learning. IEEE Trans. Very Large Scale Integr. Syst. 25 (11) (2017)
Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg
Learning the process for correlation analysis. VTS (2017)
Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev
Built-in self-test for stability measurement of low dropout regulator. ITC (2017)
Xiaoxiao Wang, Pengyuan Jiao, Mehdi Sadi, Donglin Su, LeRoy Winemberg, Mark M. Tehranipoor
TRO: An On-Chip Ring Oscillator-Based GHz Transient IR-Drop Monitor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (5) (2017)
Mehdi Sadi, Gustavo K. Contreras, Dat Tran, Jifeng Chen, LeRoy Winemberg, Mark M. Tehranipoor
BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning. ITC (2016)
Miao Tony He, Gustavo K. Contreras, Mark M. Tehranipoor, Dat Tran, LeRoy Winemberg
Test-point insertion efficiency analysis for LBIST applications. VTS (2016)
Xiaoxiao Wang, Dongrong Zhang, Donglin Su, LeRoy Winemberg, Mark M. Tehranipoor
A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 24 (5) (2016)
Liting Yu, Xiaoxiao Wang, Yuanqing Cheng, Xiaoying Zhao, Pengyuan Jiao, Aixin Chen, Donglin Su, LeRoy Winemberg, Mehdi Sadi, Mark M. Tehranipoor
An efficient all-digital IR-Drop Alarmer for DVFS-based SoC. ISCAS (2016)
Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak
Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. ITC (2016)
Gustavo K. Contreras, Yang Zhao, Nisar Ahmed, LeRoy Winemberg, Mohammad Tehranipoor
LBIST pattern reduction by learning ATPG test cube properties. ISQED (2015)
Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch
Generalization of an outlier model into a "global" perspective. ITC (2015)
Mehdi Sadi, Mark M. Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg
Speed Binning Using Machine Learning And On-chip Slack Sensors. ACM Great Lakes Symposium on VLSI (2015)
Gustavo K. Contreras, Nisar Ahmed, LeRoy Winemberg, Mark M. Tehranipoor
Predictive LBIST model and partial ATPG for seed extraction. DFTS (2015)
Xiaoxiao Wang, LeRoy Winemberg, Donglin Su, Dat Tran, Saji George, Nisar Ahmed, Steve Palosh, Allan Dobin, Mark M. Tehranipoor
Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (1) (2015)
Mehdi Sadi, LeRoy Winemberg, Mark M. Tehranipoor
A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs. VTS (2015)
Qihang Shi, Mohammad Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg
On-chip sensor selection for effective speed-binning. MWSCAS (2014)
Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor
Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests. VTS (2014)
Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. J. Electron. Test. 29 (1) (2013)
Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev
Fault analysis and simulation of large scale industrial mixed-signal circuits. DATE (2013)
Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Screening customer returns with multivariate test analysis. ITC (2012)
Xiaoxiao Wang, Mohammad Tehranipoor, Saji George, Dat Tran, LeRoy Winemberg
Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements. IEEE Trans. Very Large Scale Integr. Syst. 20 (8) (2012)
Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor
Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements. ITC (2012)
Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
Critical Fault-Based Pattern Generation for Screening SDDs. ETS (2011)
Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg
In-field aging measurement and calibration for power-performance optimization. DAC (2011)
LeRoy Winemberg, Mohammad Tehranipoor
Special session: Hot topic: Smart silicon. VTS (2011)
Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg
Special session 5B: Panel How much toggle activity should we be testing with? VTS (2011)
Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor
Case Study: Efficient SDD test generation for very large integrated circuits. VTS (2011)
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Understanding customer returns from a test perspective. VTS (2011)
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Forward prediction based on wafer sort data - A case study. ITC (2011)
Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE (2011)
Dat Tran, LeRoy Winemberg, Darrell Carder, Xijiang Lin, Joe LeBritton, Bruce Swanson
Detecting and diagnosing open defects. ITC (2010)
LeRoy Winemberg
Outsourcing DFT: it can be done but it isn't easy. ITC (2005)