BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning.
Mehdi SadiGustavo K. ContrerasDat TranJifeng ChenLeRoy WinembergMark M. TehranipoorPublished in: ITC (2016)
Keyphrases
- built in self test
- machine learning
- high speed
- integrated circuit
- machine learning algorithms
- management system
- information management
- machine learning methods
- decision support
- data management
- knowledge acquisition
- data processing
- decision making
- data mining
- reliability analysis
- artificial intelligence
- information systems
- learning tasks
- power consumption
- knowledge discovery
- learning systems
- decision trees
- reinforcement learning
- pattern recognition
- knowledge management
- data analysis
- neural network
- active learning
- low cost
- machine learning approaches
- explanation based learning
- network management
- supervised learning
- analog vlsi
- ibm zenterprise
- information extraction