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Case Study: Efficient SDD test generation for very large integrated circuits.
Ke Peng
Fang Bao
Geoff Shofner
LeRoy Winemberg
Mohammad Tehranipoor
Published in:
VTS (2011)
Keyphrases
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integrated circuit
test generation
case study
database
database systems
real world
metadata
test cases
efficient implementation
project management
quality assurance