Mohammad Tehranipoor

Publication Activity (10 Years)

Years Active: 2005-2015
Publications (10 Years): 0

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

J. Electron. Test.

VTS

Asian Test Symposium

Publications

Gustavo K. Contreras, Yang Zhao, Nisar Ahmed, LeRoy Winemberg, Mohammad Tehranipoor
LBIST pattern reduction by learning ATPG test cube properties. ISQED (2015)
Shane Kelly, Xuehui Zhang, Mohammad Tehranipoor, Andrew Ferraiuolo
Detecting Hardware Trojans using On-chip Sensors in an ASIC Design. J. Electron. Test. 31 (1) (2015)
Md. Tauhidur Rahman, Domenic Forte, Jim Fahrny, Mohammad Tehranipoor
ARO-PUF: An aging-resistant ring oscillator PUF design. DATE (2014)
Shuo Wang, Mohammad Tehranipoor
Light-Weight On-Chip Structure for Measuring Timing Uncertainty Induced by Noise in Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 22 (5) (2014)
Alison Hosey, Md. Tauhidur Rahman, Kan Xiao, Domenic Forte, Mohammad Tehranipoor
Advanced Analysis of Cell Stability for Reliable SRAM PUFs. ATS (2014)
Ilia Polian, Mohammad Tehranipoor
Guest Editorial. IET Comput. Digit. Tech. 8 (6) (2014)
Qihang Shi, Mohammad Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg
On-chip sensor selection for effective speed-binning. MWSCAS (2014)
Mohammad Tehranipoor, Domenic Forte
Tutorial T4: All You Need to Know about Hardware Trojans and Counterfeit ICs. VLSI Design (2014)
Md. Tauhidur Rahman, Kan Xiao, Domenic Forte, Xuhei Zhang, Jerry Shi, Mohammad Tehranipoor
TI-TRNG: Technology Independent True Random Number Generator. DAC (2014)
Kan Xiao, Domenic Forte, Mohammad Tehranipoor
A Novel Built-In Self-Authentication Technique to Prevent Inserting Hardware Trojans. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (12) (2014)
Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. IEICE Trans. Inf. Syst. (10) (2014)
Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor
Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests. VTS (2014)
Miao Tony He, Mohammad Tehranipoor
SAM: A comprehensive mechanism for accessing embedded sensors in modern SoCs. DFT (2014)
Kan Xiao, Md. Tauhidur Rahman, Domenic Forte, Yu Huang, Mei Su, Mohammad Tehranipoor
Bit selection algorithm suitable for high-volume production of SRAM-PUF. HOST (2014)
Jifeng Chen, Shuo Wang, Mohammad Tehranipoor
Critical-reliability path identification and delay analysis. ACM J. Emerg. Technol. Comput. Syst. 10 (2) (2014)
Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment. J. Electron. Test. 30 (1) (2014)
Xuehui Zhang, Mohammad Tehranipoor
Design of On-Chip Lightweight Sensors for Effective Detection of Recycled ICs. IEEE Trans. Very Large Scale Integr. Syst. 22 (5) (2014)
Md. Tauhidur Rahman, Domenic Forte, Quihang Shi, Gustavo K. Contreras, Mohammad Tehranipoor
CSST: An Efficient Secure Split-Test for Preventing IC Piracy. NATW (2014)
Ujjwal Guin, Xuehui Zhang, Domenic Forte, Mohammad Tehranipoor
Low-cost On-Chip Structures for Combating Die and IC Recycling. DAC (2014)
Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain. Proc. IEEE 102 (8) (2014)
Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead. J. Electron. Test. 30 (1) (2014)
Mohammad Tehranipoor, Charles Knapp
T1A: Opportunities and challenges for secure hardware and verifying trust in integrated circuits. SoCC (2014)
Gustavo K. Contreras, Md. Tauhidur Rahman, Mohammad Tehranipoor
Secure Split-Test for preventing IC piracy by untrusted foundry and assembly. DFTS (2013)
Ilia Polian, Mohammad Tehranipoor
Special session 12A: Hot topic counterfeit IC identification: How can test help? VTS (2013)
Jifeng Chen, Mohammad Tehranipoor
Critical Paths Selection and Test Cost Reduction Considering Process Variations. Asian Test Symposium (2013)
Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. Asian Test Symposium (2013)
Swarup Bhunia, Miron Abramovici, Dakshi Agrawal, Paul Bradley, Michael S. Hsiao, Jim Plusquellic, Mohammad Tehranipoor
Protection Against Hardware Trojan Attacks: Towards a Comprehensive Solution. IEEE Des. Test 30 (3) (2013)
Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects. IEEE Trans. Very Large Scale Integr. Syst. 21 (6) (2013)
Fang Bao, Mohammad Tehranipoor, Harry Chen
Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise. Asian Test Symposium (2013)
Azadeh Davoodi, Min Li, Mohammad Tehranipoor
A Sensor-Assisted Self-Authentication Framework for Hardware Trojan Detection. IEEE Des. Test 30 (5) (2013)
Jifeng Chen, Mohammad Tehranipoor
A novel flow for reducing clock skew considering NBTI effect and process variations. ISQED (2013)
Hassan Salmani, Mohammad Tehranipoor, Ramesh Karri
On design vulnerability analysis and trust benchmarks development. ICCD (2013)
Ujjwal Guin, Domenic Forte, Mohammad Tehranipoor
Anti-counterfeit Techniques: From Design to Resign. MTV (2013)
Kan Xiao, Mohammad Tehranipoor
BISA: Built-in self-authentication for preventing hardware Trojan insertion. HOST (2013)
Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. J. Electron. Test. 29 (1) (2013)
Xuehui Zhang, Andrew Ferraiuolo, Mohammad Tehranipoor
Detection of trojans using a combined ring oscillator network and off-chip transient power analysis. ACM J. Emerg. Technol. Comput. Syst. 9 (3) (2013)
Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor
Functional Fmax test-time reduction using novel DFTs for circuit initialization. ICCD (2013)
Fang Bao, Ke Peng, Mohammad Tehranipoor, Krishnendu Chakrabarty
Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (10) (2013)
Xuehui Zhang, Kan Xiao, Mohammad Tehranipoor, Jeyavijayan Rajendran, Ramesh Karri
A study on the effectiveness of Trojan detection techniques using a red team blue team approach. VTS (2013)
Kan Xiao, Xuehui Zhang, Mohammad Tehranipoor
A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay. IEEE Des. Test 30 (2) (2013)
Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty
Power-safe application of tdf patterns to flip-chip designs during wafer test. ACM Trans. Design Autom. Electr. Syst. 18 (3) (2013)
Hassan Salmani, Mohammad Tehranipoor
Analyzing circuit vulnerability to hardware Trojan insertion at the behavioral level. DFTS (2013)
Jifeng Chen, Shuo Wang, Mohammad Tehranipoor
Efficient selection and analysis of critical-reliability paths and gates. ACM Great Lakes Symposium on VLSI (2012)
Andrew Ferraiuolo, Xuehui Zhang, Mohammad Tehranipoor
Experimental analysis of a ring oscillator network for hardware Trojan detection in a 90nm ASIC. ICCAD (2012)
Shuo Wang, Mohammad Tehranipoor
TSUNAMI: a light-weight on-chip structure for measuring timing uncertainty induced by noise during functional and test operations. ACM Great Lakes Symposium on VLSI (2012)
Hassan Salmani, Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty, Patrick Girard, Xiaoqing Wen
Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns. J. Low Power Electron. 8 (2) (2012)
Xuehui Zhang, Nicholas Tuzzio, Mohammad Tehranipoor
Identification of recovered ICs using fingerprints from a light-weight on-chip sensor. DAC (2012)
Xuehui Zhang, Kan Xiao, Mohammad Tehranipoor
Path-delay fingerprinting for identification of recovered ICs. DFT (2012)
Hassan Salmani, Mohammad Tehranipoor
Layout-Aware Switching Activity Localization to Enhance Hardware Trojan Detection. IEEE Trans. Inf. Forensics Secur. 7 (1) (2012)
Wei Zhao, Mohammad Tehranipoor
PowerMAX: Fast Power Analysis during Test. Asian Test Symposium (2012)
Junxia Ma, Mohammad Tehranipoor, Patrick Girard
A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk. J. Electron. Test. 28 (2) (2012)
Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
On pinpoint capture power management in at-speed scan test generation. ITC (2012)
Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor
A novel method for fast identification of peak current during test. VTS (2012)
Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic
A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time. IEEE Trans. Very Large Scale Integr. Syst. 20 (1) (2012)
Shuo Wang, Jifeng Chen, Mohammad Tehranipoor
Representative Critical Reliability Paths for low-cost and accurate on-chip aging evaluation. ICCAD (2012)
Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty
Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits. J. Low Power Electron. 8 (2) (2012)
Nicholas Tuzzio, Kan Xiao, Xuehui Zhang, Mohammad Tehranipoor
A zero-overhead IC identification technique using clock sweeping and path delay analysis. ACM Great Lakes Symposium on VLSI (2012)
Min Li, Azadeh Davoodi, Mohammad Tehranipoor
A sensor-assisted self-authentication framework for hardware trojan detection. DATE (2012)
Xiaoxiao Wang, Mohammad Tehranipoor, Saji George, Dat Tran, LeRoy Winemberg
Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements. IEEE Trans. Very Large Scale Integr. Syst. 20 (8) (2012)
Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor
Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements. ITC (2012)
Wei Zhao, Mohammad Tehranipoor
Peak power identification on power bumps during test application. IGCC (2011)
Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
Critical Fault-Based Pattern Generation for Screening SDDs. ETS (2011)
Mohammad Tehranipoor, Hassan Salmani, Xuehui Zhang, Michel Wang, Ramesh Karri, Jeyavijayan Rajendran, Kurt Rosenfeld
Trustworthy Hardware: Trojan Detection and Design-for-Trust Challenges. Computer 44 (7) (2011)
Junxia Ma, Nisar Ahmed, Mohammad Tehranipoor
Low-cost diagnostic pattern generation and evaluation procedures for noise-related failures. VTS (2011)
Xuehui Zhang, Nicholas Tuzzio, Mohammad Tehranipoor
Red team: Design of intelligent hardware trojans with known defense schemes. ICCD (2011)
Charles Lamech, Reza M. Rad, Mohammad Tehranipoor, Jim Plusquellic
An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities. IEEE Trans. Inf. Forensics Secur. 6 (3-2) (2011)
Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg
In-field aging measurement and calibration for power-performance optimization. DAC (2011)
Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty
Power-safe test application using an effective gating approach considering current limits. VTS (2011)
Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty
A Metric to Target Small-Delay Defects in Industrial Circuits. IEEE Des. Test Comput. 28 (2) (2011)
LeRoy Winemberg, Mohammad Tehranipoor
Special session: Hot topic: Smart silicon. VTS (2011)
Fang Bao, Ke Peng, Krishnendu Chakrabarty, Mohammad Tehranipoor
On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage. Asian Test Symposium (2011)
Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg
Special session 5B: Panel How much toggle activity should we be testing with? VTS (2011)
Xuehui Zhang, Mohammad Tehranipoor
RON: An on-chip ring oscillator network for hardware Trojan detection. DATE (2011)
Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor
Case Study: Efficient SDD test generation for very large integrated circuits. VTS (2011)
Junxia Ma, Mohammad Tehranipoor
Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (12) (2011)
Xuehui Zhang, Mohammad Tehranipoor
Case study: Detecting hardware Trojans in third-party digital IP cores. HOST (2011)
Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor
Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS (2011)
Junxia Ma, Mohammad Tehranipoor, Ozgur Sinanoglu, Sobeeh Almukhaizim
Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG. IDT (2010)
Xiaoxiao Wang, Mohammad Tehranipoor
Novel Physical Unclonable Function with process and environmental variations. DATE (2010)
Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed
Is test power reduction through X-filling good enough? ITC (2010)
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (5) (2010)
Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor
High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. IEICE Trans. Inf. Syst. (1) (2010)
Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Xiaoqing Wen, Nisar Ahmed
A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes. J. Low Power Electron. 6 (2) (2010)
Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic
A layout-aware approach for improving localized switching to detect hardware Trojans in integrated circuits. WIFS (2010)
Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor
Emulating and diagnosing IR-drop by using dynamic SDF. ASP-DAC (2010)
Junxia Ma, Jeremy Lee, Mohammad Tehranipoor, Nisar Ahmed, Patrick Girard
Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric. ACM Great Lakes Symposium on VLSI (2010)
Ke Peng, Yu Huang, Pinki Mallick, Wu-Tung Cheng, Mohammad Tehranipoor
Full-circuit SPICE simulation based validation of dynamic delay estimation. ETS (2010)
Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
A novel hybrid method for SDD pattern grading and selection. VTS (2010)
Ramesh Karri, Jeyavijayan Rajendran, Kurt Rosenfeld, Mohammad Tehranipoor
Trustworthy Hardware: Identifying and Classifying Hardware Trojans. Computer 43 (10) (2010)
Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
A Noise-Aware Hybrid Method for SDD Pattern Grading and Selection. Asian Test Symposium (2010)
Sandeep Kumar Goel, Krishnendu Chakrabarty, Mahmut Yilmaz, Ke Peng, Mohammad Tehranipoor
Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. Asian Test Symposium (2010)
Mohammad Tehranipoor, Farinaz Koushanfar
A Survey of Hardware Trojan Taxonomy and Detection. IEEE Des. Test Comput. 27 (1) (2010)
Nisar Ahmed, Mohammad Tehranipoor
A Novel IR-Drop Tolerant Transition Delay Fault Test Pattern Generation Procedure. J. Low Power Electron. 6 (1) (2010)
Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty
Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test. Asian Test Symposium (2010)
Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty
High-quality pattern selection for screening small-delay defects considering process variations and crosstalk. DATE (2010)
Mohammad Tehranipoor, Farinaz Koushanfar
Guest Editors' Introduction: Confronting the Hardware Trustworthiness Problem. IEEE Des. Test Comput. 27 (1) (2010)
Mohammad Tehranipoor, Kenneth M. Butler
Power Supply Noise: A Survey on Effects and Research. IEEE Des. Test Comput. 27 (2) (2010)
Reza M. Rad, James F. Plusquellic, Mohammad Tehranipoor
A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions. IEEE Trans. Very Large Scale Integr. Syst. 18 (12) (2010)
Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen
Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. DDECS (2010)
Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Datta
A novel architecture for on-chip path delay measurement. ITC (2009)

Mohammad Tehranipoor.css-eqlu8i{font-size:small;padding-left:4px;}

Publication Activity (10 Years)

Top Topics

Top Venues

Mohammad Tehranipoor