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Is test power reduction through X-filling good enough?

Fangmei WuLuigi DililloAlberto BosioPatrick GirardSerge PravossoudovitchArnaud VirazelMohammad TehranipoorKohei MiyaseXiaoqing WenNisar Ahmed
Published in: ITC (2010)
Keyphrases
  • power reduction
  • power consumption
  • low power
  • power saving
  • pattern recognition