Power-aware test generation with guaranteed launch safety for at-speed scan testing.
Xiaoqing WenKazunari EnokimotoKohei MiyaseYuta YamatoMichael A. KochteSeiji KajiharaPatrick GirardMohammad TehranipoorPublished in: VTS (2011)
Keyphrases
- test generation
- test cases
- symbolic execution
- test sequences
- code coverage
- design automation
- software testing
- fuel consumption
- static analysis
- quality assurance
- mutation testing
- high speed
- power consumption
- test data generation
- life cycle
- regression testing
- information systems
- artificial intelligence
- data sets
- testing process
- test set
- traffic safety