Kazunari Enokimoto

Publication Activity (10 Years)

Years Active: 2009-2013
Publications (10 Years): 0

Top Topics

Evaluation Model

Data Compression

Correlation Coefficient

Top Venues

Publications

Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang
On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. VLSI Design (2013)
Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara
A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. VTS (2012)
Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Asian Test Symposium (2011)
Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich
SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. ISLPED (2011)
Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor
Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS (2011)
Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa
CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. Asian Test Symposium (2009)