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Masao Aso
Publication Activity (10 Years)
Years Active: 2009-2020
Publications (10 Years): 2
Top Topics
Binary Relations
South East
Correlation Coefficient
Evaluation Metrics
Top Venues
VTS
IEICE Trans. Inf. Syst.
IOLTS
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Publications
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Takeshi Iwasaki
,
Masao Aso
,
Haruji Futami
,
Satoshi Matsunaga
,
Yousuke Miyake
,
Takaaki Kato
,
Seiji Kajihara
,
Yukiya Miura
,
Smith Lai
,
Gavin Hung
,
Harry H. Chen
,
Haruo Kobayashi
,
Kazumi Hatayama
Innovative Test Practices in Asia.
VTS
(2020)
Yousuke Miyake
,
Takaaki Kato
,
Seiji Kajihara
,
Masao Aso
,
Haruji Futami
,
Satoshi Matsunaga
,
Yukiya Miura
On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test.
IOLTS
(2020)
Kohei Miyase
,
Ryota Sakai
,
Xiaoqing Wen
,
Masao Aso
,
Hiroshi Furukawa
,
Yuta Yamato
,
Seiji Kajihara
A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing.
IEICE Trans. Inf. Syst.
(9) (2013)
Kohei Miyase
,
Masao Aso
,
Ryou Ootsuka
,
Xiaoqing Wen
,
Hiroshi Furukawa
,
Yuta Yamato
,
Kazunari Enokimoto
,
Seiji Kajihara
A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits.
VTS
(2012)
Kohei Miyase
,
Xiaoqing Wen
,
Masao Aso
,
Hiroshi Furukawa
,
Yuta Yamato
,
Seiji Kajihara
Transition-Time-Relation based capture-safety checking for at-speed scan test generation.
DATE
(2011)
Kazunari Enokimoto
,
Xiaoqing Wen
,
Yuta Yamato
,
Kohei Miyase
,
H. Sone
,
Seiji Kajihara
,
Masao Aso
,
Hiroshi Furukawa
CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.
Asian Test Symposium
(2009)