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On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test.
Yousuke Miyake
Takaaki Kato
Seiji Kajihara
Masao Aso
Haruji Futami
Satoshi Matsunaga
Yukiya Miura
Published in:
IOLTS (2020)
Keyphrases
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false alarms
high speed
detection rate
detection algorithm
low cost
anomaly detection
evaluation methods
test cases
false positives
test data
automatic detection
daily life
single chip
object detection
detection accuracy
high density
physical design