Yousuke Miyake

Publication Activity (10 Years)

Years Active: 2012-2022
Publications (10 Years): 12

Top Topics

Programmable Logic

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Takaaki Kato, Yousuke Miyake, Seiji Kajihara
On Correction of A Delay Value Using Ring-Oscillators for Aging Detection and Prediction. ATS (2022)
Poki Chen, Joshua Adiel Wijaya, Seiji Kajihara, Trio Adiono, Hsiang-Yu Chen, Ruei-Ting Wang, Yousuke Miyake
A 1-ps Bin Size 4.87-ps Resolution FPGA Time-to-Digital Converter Based on Phase Wrapping Sorting and Selection. IEEE Access 10 (2022)
Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama
Innovative Test Practices in Asia. VTS (2020)
Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura
On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. IOLTS (2020)
Poki Chen, Jian-Ting Lan, Ruei-Ting Wang, Nguyen My Qui, John Carl Joel S. Marquez, Seiji Kajihara, Yousuke Miyake
High-Precision PLL Delay Matrix With Overclocking and Double Data Rate for Accurate FPGA Time-to-Digital Converters. IEEE Trans. Very Large Scale Integr. Syst. 28 (4) (2020)
Masayuki Gondo, Yousuke Miyake, Takaaki Kato, Seiji Kajihara
On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor. ATS (2020)
Yousuke Miyake, Takaaki Kato, Seiji Kajihara
Path Delay Measurement with Correction for Temperature And Voltage Variations. ITC-Asia (2020)
Yousuke Miyake, Seiji Kajihara, Poki Chen
On-Chip Test Clock Validation Using A Time-to-Digital Converter in FPGAs. ITC-Asia (2019)
Yousuke Miyake, Yasuo Sato, Seiji Kajihara
On-Chip Delay Measurement for In-Field Test of FPGAs. PRDC (2019)
Yousuke Miyake, Yasuo Sato, Seiji Kajihara
A Selection Method of Ring Oscillators for An On-Chip Digital Temperature And Voltage Sensor. ITC-Asia (2019)
Yousuke Miyake, Yasuo Sato, Seiji Kajihara
On the effects of real time and contiguous measurement with a digital temperature and voltage sensor. ITC-Asia (2017)
Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Yukiya Miura
Temperature and Voltage Measurement for Field Test Using an Aging-Tolerant Monitor. IEEE Trans. Very Large Scale Integr. Syst. 24 (11) (2016)
Seiji Kajihara, Yousuke Miyake, Yasuo Sato, Yukiya Miura
An On-Chip Digital Environment Monitor for Field Test. ATS (2014)
Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Yukiya Miura
Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor for Field Test. ATS (2014)
Yasuo Sato, Masafumi Monden, Yousuke Miyake, Seiji Kajihara
Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA. PRDC (2014)
Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara
On-chip temperature and voltage measurement for field testing. ETS (2012)