Sign in

High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.

Kohei MiyaseXiaoqing WenHiroshi FurukawaYuta YamatoSeiji KajiharaPatrick GirardLaung-Terng WangMohammad Tehranipoor
Published in: IEICE Trans. Inf. Syst. (2010)
Keyphrases
  • test cases
  • test suite
  • software testing
  • test data
  • test generation
  • power reduction
  • statistical tests
  • high speed
  • power consumption
  • low power
  • real time
  • image processing
  • power dissipation