Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead.

Ujjwal Guin Daniel DiMase Mohammad Tehranipoor

Published in: J. Electron. Test. (2014)

Keyphrases

integrated circuit
automatic detection
detection accuracy
object detection
false positives
electron beam
detection rate
lessons learned
detection method
detection algorithm
real world
real time
image processing
e learning
genetic algorithm
face detection
anomaly detection