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- Rama Chellappa
- Shiguang Shan
- Xilin Chen
- Stan Z. Li
- Wen Gao
- Josef Kittler
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- Ioannis Pitas
- Zhen Lei
- Xiaoou Tang
- Thomas S. Huang
- Anil K. Jain
- Sébastien Marcel
- Marios Savvides
- Yunhong Wang
- Vishal M. Patel
- Xiaoming Liu
- Junjie Yan
- Christoph Busch
- Richa Singh
- Mayank Vatsa
- Stefanos Zafeiriou
- Xiaogang Wang
- Guoying Zhao
- Anastasios Tefas
- Weihong Deng
- Seong-Whan Lee
- Yang Liu
- Jian Yang
- Licheng Jiao
- Tieniu Tan
- Shuicheng Yan
- Daijin Kim
- Nasser M. Nasrabadi
- David Zhang
- Kin-Man Lam
- Wei Liu
- Xinbo Gao
- Xin Wang
Venues
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- IEEE Access
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- ICIP
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- Pattern Recognit.
- IEEE Trans. Geosci. Remote. Sens.
- ICPR
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- IEEE Trans. Instrum. Meas.
- Expert Syst. Appl.
- Pattern Recognit. Lett.
- IJCNN
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- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Image Process.
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- WACV
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- Image Vis. Comput.
- SMC
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Ind. Electron.
- Comput. Electron. Agric.
- ICRA
- AAAI
- IROS
- Int. J. Pattern Recognit. Artif. Intell.
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