Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric.
Junxia MaJeremy LeeMohammad TehranipoorNisar AhmedPatrick GirardPublished in: ACM Great Lakes Symposium on VLSI (2010)
Keyphrases
- power supply
- quality metrics
- image quality
- quality estimation
- quality assessment
- intelligent control
- structural similarity
- high frequency
- visual quality
- perceptual quality
- human visual system
- signal to noise ratio
- image quality assessment
- human perception
- image quality metrics
- peak signal to noise ratio
- image processing
- low level