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A zero-overhead IC identification technique using clock sweeping and path delay analysis.

Nicholas TuzzioKan XiaoXuehui ZhangMohammad Tehranipoor
Published in: ACM Great Lakes Symposium on VLSI (2012)
Keyphrases
  • image analysis
  • case study
  • statistical analysis
  • databases
  • feature selection
  • similarity measure
  • control system