A Metric to Target Small-Delay Defects in Industrial Circuits.

Mahmut Yilmaz Mohammad Tehranipoor Krishnendu Chakrabarty

Published in: IEEE Des. Test Comput. (2011)

Keyphrases

high speed
industrial applications
real time
high dimensional
small number
target tracking
data sets
infrared
target object
defect detection
technology transfer
electronic circuits