Fan Yang

Publication Activity (10 Years)

Years Active: 2008-2014
Publications (10 Years): 0

Top Topics

Evaluation Methods

Top Venues

Publications

Fan Yang, Sreejit Chakravarty, Arun Gunda, Nicole Wu, Jianyu Ning
Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests. ATS (2014)
Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor
A novel method for fast identification of peak current during test. VTS (2012)
Sreejit Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, H. Guo, R. Lai, D. Li
Silicon evaluation of faster than at-speed transition delay tests. VTS (2012)
Fan Yang, Sreejit Chakravarty
Testing of latch based embedded arrays using scan tests. ITC (2010)
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
Improving the Detectability of Resistive Open Faults in Scan Cells. DFT (2009)
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
Detectability of internal bridging faults in scan chains. ASP-DAC (2009)
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
An Enhanced Logic BIST Architecture for Online Testing. IOLTS (2008)
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
On the Detectability of Scan Chain Internal Faults - An Industrial Case Study. VTS (2008)
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
Detection of Internal Stuck-open Faults in Scan Chains. ITC (2008)
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells. DFT (2008)