Arun Gunda

Publication Activity (10 Years)

Years Active: 1995-2014
Publications (10 Years): 0

Top Topics

Evaluation Methods

Top Venues

Publications

Fan Yang, Sreejit Chakravarty, Arun Gunda, Nicole Wu, Jianyu Ning
Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests. ATS (2014)
Sreejit Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, H. Guo, R. Lai, D. Li
Silicon evaluation of faster than at-speed transition delay tests. VTS (2012)
Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz
Multiple fault activation cycle tests for transistor stuck-open faults. ITC (2010)
Narendra Devta-Prasanna, Arun Gunda
Clock Gate Test Points. ITC (2010)
Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy
Accurate measurement of small delay defect coverage of test patterns. ITC (2009)
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
Comparative study of centralised and distributed compatibility-based test data compression. IET Comput. Digit. Tech. 2 (2) (2008)
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
Systematic Scan Reconfiguration. ASP-DAC (2007)
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26 (5) (2007)
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. ETS (2006)
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
Test Generation for Open Defects in CMOS Circuits. DFT (2006)
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
Should Illinois-Scan Based Architectures be Centralized or Distributed? DFT (2005)
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. ICCD (2005)
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
Methods for improving transition delay fault coverage using broadside tests. ITC (2005)
Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz
Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. Asian Test Symposium (2005)
Kaushik De, Arun Gunda
Failure Analysis for Full-Scan Circuits. ITC (1995)