A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults.
Narendra Devta-PrasannaArun GundaP. KrishnamurthySudhakar M. ReddyIrith PomeranzPublished in: ETS (2006)
Keyphrases
- detection method
- cost function
- high accuracy
- pairwise
- computationally efficient
- prior knowledge
- significant improvement
- probabilistic model
- data sets
- high speed
- support vector machine
- integrated circuit
- test cases
- synthetic data
- optimization algorithm
- support vector machine svm
- experimental evaluation
- dynamic programming
- bayesian networks
- image processing