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Methods for improving transition delay fault coverage using broadside tests.
Narendra Devta-Prasanna
Arun Gunda
P. Krishnamurthy
Sudhakar M. Reddy
Irith Pomeranz
Published in:
ITC (2005)
Keyphrases
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computationally expensive
database systems
significant improvement
computational cost
empirical studies
machine learning
information retrieval
case study
three dimensional
preprocessing
sufficient conditions
benchmark datasets