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Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions.
Narendra Devta-Prasanna
Sudhakar M. Reddy
Arun Gunda
P. Krishnamurthy
Irith Pomeranz
Published in:
Asian Test Symposium (2005)
Keyphrases
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flip flops
image processing
markov random field
power dissipation