Accurate measurement of small delay defect coverage of test patterns.
Narendra Devta-PrasannaSandeep Kumar GoelArun GundaMark WardP. KrishnamurthyPublished in: ITC (2009)
Keyphrases
- high quality
- test suite
- small number
- set of test cases
- high accuracy
- test cases
- pattern discovery
- software testing
- computationally efficient
- pattern mining
- frequent patterns
- coherent regions
- statistical significance
- interesting patterns
- pattern analysis
- machine vision
- neural network
- knowledge discovery
- information systems
- machine learning
- data mining