Login / Signup
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration.
Ahmad A. Al-Yamani
Narendra Devta-Prasanna
Erik Chmelar
M. Grinchuk
Arun Gunda
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
</>
power reduction
low cost
power consumption
low power
wireless sensor networks
fine grained
low complexity