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Wei Zhao
Publication Activity (10 Years)
Years Active: 2010-2021
Publications (10 Years): 1
Top Topics
Pattern Mining
Power Analysis
Random Access
Multiview Video Coding
Top Venues
J. Low Power Electron.
Proc. IEEE
VTS
ACM Trans. Design Autom. Electr. Syst.
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Publications
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Patrick Girard
,
Yuanqing Cheng
,
Arnaud Virazel
,
Wei Zhao
,
Rajendra Bishnoi
,
Mehdi B. Tahoori
A Survey of Test and Reliability Solutions for Magnetic Random Access Memories.
Proc. IEEE
109 (2) (2021)
Wei Zhao
,
Junxia Ma
,
Mohammad Tehranipoor
,
Sreejit Chakravarty
Power-safe application of tdf patterns to flip-chip designs during wafer test.
ACM Trans. Design Autom. Electr. Syst.
18 (3) (2013)
Hassan Salmani
,
Wei Zhao
,
Mohammad Tehranipoor
,
Sreejit Chakravarty
,
Patrick Girard
,
Xiaoqing Wen
Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns.
J. Low Power Electron.
8 (2) (2012)
Wei Zhao
,
Mohammad Tehranipoor
PowerMAX: Fast Power Analysis during Test.
Asian Test Symposium
(2012)
Wei Zhao
,
Sreejit Chakravarty
,
Junxia Ma
,
Narendra Devta-Prasanna
,
Fan Yang
,
Mohammad Tehranipoor
A novel method for fast identification of peak current during test.
VTS
(2012)
Wei Zhao
,
Mohammad Tehranipoor
,
Sreejit Chakravarty
Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits.
J. Low Power Electron.
8 (2) (2012)
Wei Zhao
,
Mohammad Tehranipoor
Peak power identification on power bumps during test application.
IGCC
(2011)
Wei Zhao
,
Mohammad Tehranipoor
,
Sreejit Chakravarty
Power-safe test application using an effective gating approach considering current limits.
VTS
(2011)
Wei Zhao
,
Junxia Ma
,
Mohammad Tehranipoor
,
Sreejit Chakravarty
Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test.
Asian Test Symposium
(2010)
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Junxia Ma
,
Wei Zhao
,
Mohammad Tehranipoor
,
Xiaoqing Wen
Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes.
DDECS
(2010)