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A Survey of Test and Reliability Solutions for Magnetic Random Access Memories.

Patrick GirardYuanqing ChengArnaud VirazelWei ZhaoRajendra BishnoiMehdi B. Tahoori
Published in: Proc. IEEE (2021)
Keyphrases
  • random access
  • solid state
  • disk storage
  • memory size
  • multiview video coding
  • flash memory
  • optimal solution
  • magnetic field
  • low complexity
  • processing elements