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Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test.

Wei ZhaoJunxia MaMohammad TehranipoorSreejit Chakravarty
Published in: Asian Test Symposium (2010)
Keyphrases
  • data mining
  • fault detection
  • database
  • machine learning
  • genetic algorithm
  • control system
  • data mining techniques
  • decision support
  • design patterns