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Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells.
Fan Yang
Sreejit Chakravarty
Narendra Devta-Prasanna
Sudhakar M. Reddy
Irith Pomeranz
Published in:
DFT (2008)
Keyphrases
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detection method
high speed
detection algorithm
automatic detection
detection accuracy
neural network
object detection
detection rate
low power
ridge detection
face recognition
anomaly detection
false alarms
fault detection
error detection
multiple faults