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Improving the Detectability of Resistive Open Faults in Scan Cells.
Fan Yang
Sreejit Chakravarty
Narendra Devta-Prasanna
Sudhakar M. Reddy
Irith Pomeranz
Published in:
DFT (2009)
Keyphrases
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image quality
fault diagnosis
neural network
test cases
fault detection
data sets
multiscale
image analysis
cellular automata
root cause