Testing of latch based embedded arrays using scan tests.

Fan Yang Sreejit Chakravarty

Published in: ITC (2010)

Keyphrases

test cases
test generation
test suite
power consumption
software testing
embedded systems
test data
code coverage
item response theory
scan data
digital images
multiscale
test set
low power
real world
regression testing
smart camera
neural network
databases
data sets