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A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment.
Ujjwal Guin
Daniel DiMase
Mohammad Tehranipoor
Published in:
J. Electron. Test. (2014)
Keyphrases
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statistical analysis
detection algorithm
information systems
automatic detection
conceptual framework
machine learning
artificial intelligence
detection method
theoretical framework
detection rate
visual analysis
data mining
probabilistic model
event detection
activity analysis