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Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults.

Fang BaoKe PengMahmut YilmazKrishnendu ChakrabartyLeRoy WinembergMohammad Tehranipoor
Published in: J. Electron. Test. (2013)
Keyphrases
  • pattern generation
  • social networks
  • website
  • small number
  • fault diagnosis
  • fault detection
  • information systems
  • database systems
  • expert systems
  • lightweight
  • machine vision
  • selection strategy