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On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage.

Fang BaoKe PengKrishnendu ChakrabartyMohammad Tehranipoor
Published in: Asian Test Symposium (2011)
Keyphrases
  • pattern set
  • frequent patterns
  • detection method
  • significantly higher
  • database
  • case study
  • automatic detection
  • databases
  • concurrency control
  • generation process
  • genetic algorithm
  • viewpoint
  • input image
  • data management