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Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects.

Junxia MaMohammad Tehranipoor
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • critical path
  • power supply
  • energy dissipation
  • job shop scheduling problem
  • intelligent control
  • high frequency
  • genetic algorithm
  • real time
  • image processing
  • multiresolution
  • scheduling problem
  • electrical power